Advantage and Core Benefit
- Direct measurement of waveforms of Sub-THz to THz class high-frequency electrical signals used in Beyond5G.
- By using time-varying spectral sampling light with discrete wavelengths (wavelength intervals larger than the wavelength shift), the wavelength axis of the sampling light, which is intensity-modulated by the signal to be measured, accurately displays the time axis.
- Ultra-fast waveforms can be measured with an inexpensive spectrometer without the need for an expensive broadband oscilloscope.
Background and Technology
Beyond 5G, which is expected to be widely used around 2030, is expected to utilize frequency bands of 100 GHz or higher, but measurement of time-axis intensity waveforms of high-frequency electrical signals is electrically limited, even with expensive wide-band oscilloscopes.
By intensity modulating time-variant spectral sampling light, whose wavelength varies linearly on the time axis, with a high-frequency electrical signal of the measurement target, the output of the wavelength-axis intensity waveform of the sampling light can be used to display the time-axis intensity waveform of the measurement target. However, since a wavelength shift of the modulation occurs during intensity modulation (±0.8 nm wavelength shift at 100 GHz), the wavelength shift components are mixed in the waveform in a complex manner.
Therefore, the present invention uses time-variant spectra with discrete wavelengths (wavelength interval greater than the wavelength shift) as the sampling light. This enabled the wavelength-axis intensity waveform of said sampling light to accurately display the time-axis intensity waveform.
 |
Patent
- Pending
Researcher
- Tsuyoshi KONISHI (Osaka University, Graduate School of Engineering, Associate Professor)
Expectations
- We are seeking companies to in-license this technology or work with our researchers (with technical guidance from the inventor) to further develop this technology.
Project No. HK-04462